Workshop on Intelligent Methods for Test and Reliability IMTR 22

Data collected during different test-related design, manufacturing, and operation steps bear huge potential that is heavily under-utilized today. As a consequence, test methods are undergoing a transformation triggered by the advent of next-generation artificial intelligence and data science technology.  This workshop aims at bringing the core test community together with interdisciplinary researchers working on various facets of intelligent methods within the test flow.  This workshop will leverage the interdisciplinary potentials to consider intelligent methods for test-related problems from the points of view of both: the ETS community and researchers working in different scientific areas, such as machine learning, data science, security, software engineering, and visualization.

The workshop invites submissions on, but not limited to, the following topics:

• Intelligent methods, including machine learning, data and visual analytics, for test and reliability problems (design for testability, post-silicon validation, test application, yield optimization, fault-tolerant operation)
• Secure and privacy-preserving semiconductor testing
• Intelligent techniques for system-level test
• Data-driven software engineering for handling test-related data
• Intelligent solutions for ultra-high speed, ultra-high data rate test application

A submission can describe a novel scientific result, provide a position statement about a new and relevant problem, or report a case study on practical experiences with a technique from the list above.  The submissions should not be formally published in the past.  The workshop will have no formal proceedings, so authors will be free to resubmit their work to conferences or journals.  Accepted papers can, at the discretion and with an approval of their authors, be published on the workshop’s website.

Submissions in form of full 6-page papers or 1-2 page extended abstracts (in IEEE double-column format, either A4 or US Letter) should be submitted through EasyChair:

Submission deadline: March 25, 2022 April 08, 2022 (extended)
Acceptance notification: April 20, 2022
PDF file for publishing on the workshop’s website (optional): May 10, 2022
Workshop: May 26-27, 2022
Registration:
This workshop is co-located with the IEEE European Test Symposium and will use its registration facilities. Please register through the ETS website:

This workshop is organized by the Graduate School Intelligent Methods for Test and Reliability (GS-IMTR), a joint program between the University of Stuttgart and Advantest.
General Chairs: Dirk Pflueger (University of Stuttgart, Speaker of GS-IMTR), Matthias Sauer (Advantest Europe), Matteo Sonza Reorda (Politecnico di Torino)
Program Chairs: Hussam Amrouch (University of Stuttgart), Krishnendu Chakrabarty (Duke University), Ilia Polian (University of Stuttgart)
Programm Commitee: Juergen Alt (Infineon, DE), Rob Aitken (ARM, US), Lorena Anghel (INP Grenoble, FR), Davide Appello (STMicroelectronics, IT), Paolo Bernardi (Politec. di Torino, IT), Alberto Bosio (EC Lyon, FR), Ramon Canal (UPC Barcelona, ES), John Carulli (GlobalFoundries, US), Abhijit Chatterjee (Georgia Tech, US), Harry Chen (Mediatek, TW),  Jennifer Dworak (S Methodist U, US), Piet Engelke (Infineon, DE), Andreas Gerstlauer (UT Austin, US), Dimitris Gizopoulos (U Athens, GR), Stefan Holst (Kyushu Inst Tech, JP), Yu Huang (Hisilicon, CN), Michiko Inoue (NAIST, JP), Artur Jutman (Testonica, EE), Ramesh Karri (New York U, US), Wolfgang Kunz (TU Kaiserslautern, DE), Fadi Kurdahi (UC Irvine, US), Bing Li (TU Munich, DE), Maria Michael (U of Cyprus, CY), Ulf Schlichtmann (TU Munich, DE), Mario Schoelzel (HS Nordhausen, DE), Johanna Sepulveda (Airbus, DE), Özgur Sinanoglu (New York U, UAE), Adit Singh (Auburn U, US), Haralampos Stratigopulos (Sorbonne U – LIP 6. FR), Mehdi Tahoori (Karlsruhe Inst Tech, DE), Robert Wille (Joh Kepler U Linz, AT)