Education

GS-IMTR, TSS

All doctoral candidates within GS-IMTR are required to participate in an individual qualification program, which includes technical (subject-specific) courses from the list below and soft-skill courses. Moreover, GS-IMTR plans to attract further education content by inviting guest scientists (announced in the "News" section of this website).

List of eligible courses:

  • Advanced mathematics for signal and information processing (Bin Yang)
  • Advanced Software Testing and Analysis (Stefan Wagner)
  • Circuit design in nanometer scaled CMOS (Jens Anders)
  • Deep learning (Bin Yang)
  • Detection and Pattern Recognition (Bin Yang)
  • Electronic Design Automation (Ilia Polian)
  • Hardware Oriented Security (Ilia Polian)
  • Information Visualization and Visual Analytics (Steffen Koch)
  • Introduction to Modern Cryptography (Ralf Küsters)
  • Physical Design of Integrated Circuits (Manfred Berroth)
  • RF CMOS (Jens Anders)
  • Robust System Design (Ilia Polian)
  • Scientific Visualization (Thomas Ertl)
  • Security and Privacy (Ralf Küsters)
  • Statistical and Adaptive Signal Processing (Bin Yang)
  • Statistische und Stochastische Grundlagen (Dirk Pflüger)
  • System and Web Security (Ralf Küsters)
  • Theoretical and Methodological Foundations of Visual Computing (Daniel Weiskopf)
  • High-Dimensional Data Approximation and Learning“ (Dirk Pflüger)

Schedule overview for PhD Seminar

GS-IMTR doctoral students meet biweekly for their PhD seminar.

Please refer to the table below for the currently scheduled dates and topics.

Dates Topics
14.10.2025 P11: Virtual Test for mixed-signal Circuits: Digital Twin based Development of Post-Silicon Tests
28.10.2025 Internal - prep: annual meeting
11.11.2025 No PhD seminar due to annual meeting
25.11.2025 Internal
09.12.2025 No PhD seminar due to many PhDs already left for ATS25
23.12.2025 Christmas party / no seminar due to ATS25
20.01.2026 P14: Intelligent Sensing and On-Chip Learning for Silicon Lifecyle
03.02.2026 Internal
17.02.2026 P15: Test and Reliability Challenges for Advanced Sub-5nm Technologies
03.03.2026 P12: Enhancing Test Methods by Magnetic Fields
17.03.2026 P16: Novel Test Methods for Emerging and Classical Memories using Magnetic Field
31.03.2026 Internal
14.04.2026 P17: Variable selection with automated feature design and uncertainty estimation for post-silicon validation and production
28.04.2026 Internal
12.05.2026 P18: Automatic and Dynamic Tuning beyond Post-Silicon Validation
26.05.2026 ETS26
09.06.2026 P19: Explanations for Failures from Software Testing
23.06.2026 Internal
07.07.2026 P13: Over-the-Air (OTA) production-test concepts for future millimeter-wave antenna array modules
21.07.2026 Internal
04.08.2026 PA5: AI-Driven Device-specific Tester Calibration

 

This image shows Jens Anders

Jens Anders

Prof. Dr.

Institute of Smart Sensors

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