Publications

Publications of the Graduate School Intelligent Methods for Test and Reliability

Publications

  1. 2024

    1. 79. Time and Space Optimized Storage-based BIST under Multiple  Voltages and Variations. Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand and Hans-Joachim Wunderlich. In To appear in the Proceedings of the IEEE European Test Symposium (ETS´24), The Hague, Netherland, 2024.
    2. 78. Vmin Testing under Variations: Defect vs. Fault Coverage. Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand and Hans-Joachim Wunderlich. In To appear in the Proceedings of the IEEE Latin-American Test Symposium (LATS’24), Maceio, Brazil, 2024.
    3. 77. Scenario-based test content optimization: Scan-test vs.~system-level test. Nourhan Elhamawy; Ilia Polian; Jens Anders and Matthias Sauer. In To appear in Proceedings of 42nd IEEE VLSI Test Symposium (VTS), Tempe, AZ, USA, 2024.
    4. 76. DropHD: Technology/Algorithm Co-design for Reliable Energy-efficient NVM-based Hyperdimensional Computing under Voltage Scaling. Paul R. Genssler; Mahta Mayahinia; Simon Thomann; Mehdi Tahoori and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’24), 2024.
    5. 75. In-Memory Acceleration of Hyperdimensional Genome Matching on Unreliable Emerging Technologies. Hamza E. Barkam; Sanggeon Yun; Paul R. Genssler; Che-Kai Liu; Zhuowen Zou; Hussam Amrouch and Mohsen Imani. (2024). DOI: https://doi.org/10.1109/TCSI.2024.3351966
    6. 74. Algorithm to Technology Co-Optimization for CiM-based Hyperdimensional Computing. Mahta Mayahinia; Simon Thomann; Paul R. Genssler; Christopher Münch; Hussam Amrouch and Mehdi B. Tahoori. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’24), 2024.
    7. 73. On the Severity of Self-Heating in FDSOI at Cryogenic  Temperatures: In-depth analysis from Transistors to Full Processor. Anirban Kar; Florian Klemme; Yogesh Chauhan. S and Hussam Amrouch. In Proceedings of the IEEE 62nd International Reliability  Physics Symposium  (IRPS’24), Dallas, Texas, U.S., 2024.
    8. 72. Frontiers in Edge AI with RISC-V: Hyperdimensional Computing vs. Quantized Neural Networks. Paul R. Genssler; Sandy A. Wasif; Miran Wael; Rodion Novkin and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’24), 2024.
    9. 71. WaSSaBi: Wafer Selection with Self-supervised Representations and Brain-inspired Active Learning. Karthik Pandaram; Paul R. Genssler and Hussam Amrouch. (2024). DOI: https://doi.org/10.1109/TCSI.2024.3357975
    10. 70. Experts in the Loop: Conditional Variable Selection Based on Deep Learning for Accelerating Post-Silicon Validation. Yiwen Liao; Raphael Latty and Bin Yang. IEEE Transactions on Semiconductor Manufacturing 37, 2 (2024).
    11. 69. HDCircuit: Brain-inspired Hyperdimensional Computing for Circuit Recognition. Paul R. Genssler; Lilas Alrahis; Ozgur Sinanoglu and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’24), 2024.
    12. 68. Machine Learning Unleashes Aging and Self-Heating Effects:  From Transistors to Full Processor. Hussam Amrouch; Victor van Santan; Javier Diaz Fortuny and Florian Klemme. In Proceedings of the IEEE 62nd International Reliability  Physics Symposium  (IRPS’24), Dallas, Texas, U.S., 2024.
  2. 2023

    1. 67. Approximation-Aware and Quantization-Aware Training for  Graph Neural Networks. Rodion Novkin; Florian Klemme and Hussam Amrouch. IEEE Transactions on Computers (November 2023).
    2. 66. Robust Pattern Generation for Small Delay Faults under  Process Variations. Hanieh Jafarzadeh; Florian Klemme; Jan Dennis Reimer; Zahra Paria Najafi-Haghi; Hussam Amrouch; Sybille Hellebrand and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’23), Disneyland, Anaheim, USA, 2023.
    3. 65. Exploiting the Error Resilience of the Preconditioned  Conjugate Gradient Method for Energy and Delay Optimization. Natalia Lylina; Stefan Holst; Hanieh Jafarzadeh; Alexandra . Kourfali and Hans-Joachim Wunderlich. In IEEE 29st International On-Line Testing Symposium (IOLTS`23), 2023, pp. 1–6.
    4. 64. Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm. Natalia Lylina; Stefan Holst; Hanieh Jafarzadeh; Alexandra Kourfali and Hans-Joachim Wunderlich. In International Conference on Dependable Systems and Networks (DSN’23), 2023.
    5. 63. Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips. Payam Habiby; Natalia Lylina; Chih-Hao Wang; Hans-Joachim Wunderlich; Sebastian Huhn and Rolf Drechsler. In Proceedings of the 28th IEEE European Test Symposium 2023  (ETS’ 23), Venice, Italy, 2023, pp. 6.
    6. 62. Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level. Behnaz Ranjbar; Florian Klemme; Paul R. Genssler; Hussam Amrouch; Jinhyo Jung; Shail Dave; Hwisoo So; Kyongwoo Lee; Aviral Shrivastava; Ji-Yung Lin; Pieter Weckx; Subrat Mishra; Francky Catthoor; Dwaipayan Biswas and Akash Kumar. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    7. 61. HDGIM: Hyperdimensional Genome Sequence Matching on Unreliable Highly-Scaled FeFET. Hamza Errahmouni Barkam; Sanggeon Yun; Paul R. Genssler; Zhuowen Zou; Che-Kai Liu; Hussam Amrouch and Mohsen Imani. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    8. 60. Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows. Florian Klemme; Sami Salamin and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    9. 59. Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. Zahra Paria Najafi-Haghi; Florian Klemme; Hanieh Jafarzadeh; Hussam Amrouch and Hans-Joachim Wunderlich. In Proceedings of the IEEE Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    10. 58. A Complete Design-for-Test Scheme for Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. Journal of Electronic Testing: Theory and Applications (JETTA) (January 2023), pp. 1--19. DOI: https://doi.org/10.1007/s10836-022-06038-3
    11. 57. Beyond von Neumann Era: Brain-inspired Hyperdimensional Computing to the Rescue. Hussam Amrouch; Paul R. Genssler; Mohsen Imani; Mariam Issa; Xun Jiao; Wegdan Ali Mohammadin; Gloria Sepanta and Ruixuan Wang. In 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023.
    12. 56. ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors all the Way up Processors. Hussam Amrouch and Florian Klemme. In 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023.
    13. 55. Stress-resiliency of AI implementations on FPGAs. Jonas Krautter; Paul R. Genssler; Gloria Sepanta; Hussam Amrouch and Mehdi Tahoori. In International Conference on Field Programmable Logic and Applications (FPL), 2023.
    14. 54. Modeling and Predicting Transistor Aging under Workload Dependency using Machine Learning. Paul R. Genssler; Hamza E. Barkam; Karthik Pandaram; Mohsen Imani and Hussam Amrouch. (2023). DOI: https://doi.org/10.1109/TCSI.2023.3289325
    15. 53. Blood Glucose Prediction for Type-1 Diabetics using Deep Reinforcement Learning. Peter Domanski; Aritra Ray; Farshad Firouzi; Kyle Lafata; Krishnendu Chakrabarty and Dirk Pflüger. In 2023 IEEE International Conference on Digital Health (ICDH), 2023, pp. 339--347.
    16. 52. Identifying Resistive Open Defects in Embedded Cells under Variations. Zahra Paria Najafi-Haghi and Hans-Joachim Wunderlich. Journal of Electronic Testing: Theory and Applications (JETTA) (2023), pp. 1–27. DOI: https://doi.org/10.1007/s10836-023-06044-z
    17. 51. Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. Victor van Santen; Florian Klemme; Paul R. Genssler and Hussam Amrouch. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023.
    18. 50. Reliable Hyperdimensional Reasoning on Unreliable Emerging Technologies. Hamza Errahmouni Barkam; Sanggeon Yun; Paul R. Genssler; Hanning Chen; Albi Mema; Andrew Ding; Hussam Amrouch and Mohsen Imani. In 2023 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 2023.
    19. 49. Learn to Tune: Robust Performance Tuning in Post-Silicon Validation. Peter Domanski; Dirk Pflüger and Raphaël Latty. In 2023 IEEE European Test Symposium (ETS), 2023, pp. 1--4.
    20. 48. FDSOI-based Analog Computing for Ultra-efficient Hamming Distance Similarity Calculation. Albi Mema; Simon Thomann; Paul R. Genssler and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2023). DOI: https://doi.org/10.1109/TCSI.2023.3267837
    21. 47. SyncTREE: Fast Timing Analysis for Integrated Circuit  Design through a Physics-informed Tree-based Graph Neural Network. Yuting Hu; Jiajie Li; Florian Klemme; Gi-Joon Nam; Tengfei Ma; Hussam Amrouch and Jinjun Xiong. In Thirty-seventh Conference on Neural Information Processing  Systems, 2023.
    22. 46. Tutorial: The Synergy of Hyperdimensional and In-memory Computing. Paul R. Genssler; Simon Thomann and Hussam Amrouch. In International Conference on Hardware/Software Codesign and System Synthesis (CODES/ISSS ’23 Companion), 2023.
    23. 45. Cryogenic Embedded System to Support Quantum Computing: From 5nm FinFET to Full Processor. Paul R. Genssler; Florian Klemme; Shivendra Singh Parihar; Sebastian Brandhofer; Girish Pahwa; Ilia Polian; Yogesh Singh Chauhan and Hussam Amrouch. IEEE Transactions on Quantum Engineering (2023). DOI: https://doi.org/10.1109/TQE.2023.3300833
  3. 2022

    1. 44. Online Periodic Test of Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In To appear in Proceedings of the IEEE Asian Test Symposium, Taichung, Taiwan, 2022, pp. 1--6.
    2. 43. Brain-Inspired Hyperdimensional Computing for Ultra-Efficient Edge AI. Hussam Amrouch; Mohsen Imani; Xun Jiao; Yiannis Aloimonos; Cornelia Fermuller; Dehao Yuan; Dongning Ma; Hamza Errahmouni; Paul R. Genssler and Peter Sutor. In Proceedings of the 2022 International Conference on Hardware/Software Codesign and System Synthesis, 2022.
    3. 42. Cross-layer FeFET Reliability Modeling towards Robust Hyperdimensional Computing. Shubham Kumar; Swetaki Chatterjee; Simon Thomann; Paul R. Genssler; Yogesh S. Chauhan and Hussam Amrouch. In IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC’22), 2022.
    4. 41. Mitigating the Complexity of Chip Designs with ML-based Cell Library Characterization. Florian Klemme and Hussam Amrouch. In Workshop on Intelligent Methods for Test and Reliability (IMTR’22), 2022.
    5. 40. On Extracting Reliability Information from Speed Binning. Zahra Paria Najafi-Haghi; Florian Klemme; Hussam Amrouch and Hans-Joachim Wunderlich. In Proceedings of the 27th IEEE European Test Symposium (ETS’22), Barcelona, Spain, 2022. DOI: https://doi.org/10.1109/ETS54262.2022.9810443
    6. 39. Intelligent Methods for Test and Reliability. Hussam Amrouch; Jens Anders; Steffen Becker; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; André van Hoorn; Hanieh Jafarzadeh; Ingmar Kallfass; Florian Klemme; Steffen Koch; Ralf Küsters; Andrés Lalama; Raphael Latty; Yiwen Liao; Natalia Lylina; Zahra Paria Najafi-Haghi; Dirk Pflüger; Ilia Polian; Jochen Rivoir; Matthias Sauer; Denis Schwachhofer; Steffen Templin; Christian Volmer; Stefan Wagner; Daniel Weiskopf; Hans-Joachim Wunderlich; Bin Yang and Martin Zimmermann. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, 2022, pp. 1–6.
    7. 38. Self-learning tuning for post-silicon validation. Peter Domanski; Dirk Pflüger; Jochen Rivoir and Raphael Latty. In 34. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ’22)), 2022.
    8. 37. Robust Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the Conference on Design, Automation and Test in Europe (DATE’22), Antwerp, Belgium, 2022, pp. 1--4. DOI: https://doi.org/10.23919/DATE54114.2022.9774770
    9. 36. Machine Learning for Reliability-Aware, yet Confidential Standard Cell Characterization. Florian Klemme and Hussam Amrouch. In The 34th Workshop on Test Methods and Reliability of Circuits and Systems (TuZ’22), 2022.
    10. 35. Design Close to the Edge in Advanced Technology using Machine  Learning and Brain-Inspired Algorithms. Hussam Amrouch; Florian Klemme and Paul R. Genssler. In 27th Asia and South Pacific Design Automation Conference  (ASP-DAC’22), 2022.
    11. 34. Towards practical application of mutation testing in industry — Traditional versus extreme mutation testing. Maik Betka and Stefan Wagner. Journal of Software: Evolution and Process (2022), pp. e2450. DOI: https://doi.org/10.1002/smr.2450
    12. 33. Conditional Variable Selection for Intelligent Test. Yiwen Liao; Tianjie Ge; Raphaël Latty and Bin Yang. In 1st Workshop on Intelligent Methods for Test and Reliability, co-organized with IEEE  European Test Symposium (ETS’22), Barcelona, Spain, 2022.
    13. 32. Scalable Machine Learning to Estimate the Impact of Aging on Circuits under Workload Dependency. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
    14. 31. Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022). DOI: https://doi.org/10.1109/TCSI.2022.3201431
    15. 30. Efficient and Robust Resistive Open Defect Detection based on Unsupervised Deep Learning. Yiwen Liao; Zahra Paria Najafi-Haghi; Hans-Joachim Wunderlich and Bin Yang. In IEEE International Test Conference (ITC), Anaheim, USA, 2022.
    16. 29. SCAR: Security Compliance Analysis and Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) (2022), pp. 1--14. DOI: https://doi.org/10.1109/TCAD.2022.3158250
    17. 28. All-in-Memory Brain-Inspired Computing using FeFET Synapses. Simon Thomann; Nguyen Hong Lam Giang; Paul R. Genssler and Hussam Amrouch. Frontiers in Electronics (2022). DOI: https://doi.org/10.3389/felec.2022.833260
    18. 27. Brain-Inspired Hyperdimensional Computing: How Thermal-Friendly for Edge Computing? Paul Genssler; Austin Vas and Hussam Amrouch. IEEE Embedded Systems Letters (ESL’22) (2022).
    19. 26. Variability-Aware Approximate Circuit Synthesis via Genetic Optimization. Konstantinos Balaskas; Florian Klemme; Georgios Zervakis; Kostas Siozios; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
    20. 25. Brain-Inspired Computing for Circuit Reliability Characterization. Paul R. Genssler and Hussam Amrouch. Transactions on Computers (TC) (2022). DOI: https://doi.org/10.1109/TC.2022.3151857
    21. 24. To Generalize or Not to Generalize: Towards Autoencoders in One-Class Classification. Yiwen Liao and Bin Yang. In International Joint Conference on Neural Networks (IJCNN) and IEEE World Congress on Computational Intelligence (WCCI), Padua, Italy, 2022.
    22. 23. GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation. Lilas Alrahis; Johann Knechtel; Florian Klemme; Hussam Amrouch and Ozgur Sinanoglu. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’22), ESWEEK Special Issue (2022).
    23. 22. Wafer Map Defect Identification Based on the Fusion of Pattern and Pixel Information. Yiwen Liao; Raphael Latty; Paul R. Genssler; Hussam Amrouch and Bin Yang. In IEEE International Test Conference (ITC’22), 2022.
    24. 21. A Deep-Learning-Aided Pipeline for Efficient Post-Silicon Tuning. Yiwen Liao; Jochen Rivoir; Raphaël Latty and Bin Yang. In In the 34th Workshop on Test Methods and Reliability of Circuits and Systems (TuZ 2022), Bremerhaven, Germany, 2022.
  4. 2021

    1. 20. Machine Learning for Circuit Aging Estimation under Workload Dependency. Florian Klemme and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    2. 19. Brain-Inspired Computing for Wafer Map Defect Pattern Classification. Paul R. Genssler and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    3. 18. Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures. Hussam Amrouch; Anteneh Gebregiorgis; Nan Du; Said Hamdioui and Ilia Polian. In 29th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC’21), 2021.
    4. 17. Testability-Enhancing Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’21), Virtual, 2021, pp. 1--10. DOI: https://doi.org/10.1109/ITC50571.2021.00009
    5. 16. Resistive Open Defect Classification of Embedded Cells under Variations. Zahra Paria Najafi-Haghi and Hans-Joachim Wunderlich. In Proceedings of the IEEE Latin-American Test Symposium (LATS’21), Virtual, 2021, pp. 1--6. DOI: https://doi.org/10.1109/LATS53581.2021.9651857
    6. 15. Feature Selection Using Batch-Wise Attenuation and Feature Mask Normalization. Yiwen Liao; Raphaël Latty and Bin Yang. In Proceedings of the IEEE International Joint Conference on Neural Networks (IJCNN), virtual, 2021.
    7. 14. Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems. Chih-Hao Wang; Natalia Lylina; Ahmed Atteya; Tong-Yu Hsieh and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Symposium on On-Line Testing And Robust System Design (IOLTS’21), Virtual, 2021, pp. 1--7. DOI: https://doi.org/10.1109/IOLTS52814.2021.9486710
    8. 13. Security, Reliability and Test Aspects of the RISC-V Ecosystem. Jaume Abella; Sergi Alcaide; Jens Anders; Francisco Bas; Steffen Becker; Elke De Mulder; Nourhan Elhamawy; Frank K. Gürkaynak; Helena Handschuh; Carles Hernandez; Mike Hutter; Leonidas Kosmidis; Ilia Polian; Matthias Sauer; Stefan Wagner and Francesco Regazzoni. In Proceedings of the 26th IEEE European Test Symposium (ETS’21), 2021.
    9. 12. Impact of Transistor Self-Heating  on Logic Gates. Victor M. van Santen; Linda Schillinger and Hussam Amrouch. In IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT’21), Virtual, 2021.
    10. 11. A Hybrid Protection Scheme for Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya and Hans-Joachim Wunderlich. In Proceedings of the IEEE VLSI Test Symposium (VTS’21), Virtual, 2021, pp. 1--7. DOI: https://doi.org/10.1109/VTS50974.2021.9441029
    11. 10. Machine Learning for Semiconductor Test and Reliability. Hussam Amrouch; Animesh Basak Chowdhury; Wentian Jin; Ramesh Karri; Khorrami Farshad; Prashanth Krishnamurthy; Ilia Polian; Victor M. van Santen; Benjamin Tan and Sheldon Tan. In IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    12. 9. Towards Utilizing Self-awareness During System-level Test. Denis Schwachhofer; Steffen Becker; Matthias Sauer; Stefan Wagner and Ilia Polian. In 33. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ’21)), 2021.
    13. 8. Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. Om Prakash; Chetan Dabhim; Yogesh Chauhan and Hussam Amrouch. In To appear in Proceedings of IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    14. 7. Extreme mutation testing in practice: An industrial case study. Maik Betka and Stefan Wagner. In 2021 IEEE/ACM International Conference on Automation of Software Test (AST), 2021, pp. 113–116. DOI: https://doi.org/10.1109/AST52587.2021.00021
    15. 6. Anomaly Detection Based on Selection and Weighting in Latent Space. Yiwen Liao; Alexander Bartler and Bin Yang. In Proceedings of the IEEE International Conference on Automation Science and Engineering (CASE21), Lyon, France, 2021.
    16. 5. ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems. Peter Domanski; Dirk Pflüger; Jochen Rivoir and Raphaël Latty. In 2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA), 2021, pp. 1357--1364.
    17. 4. Machine Learning for On-the-fly Reliability-Aware Cell Library Characterization. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2021).
    18. 3. Visual Neural Decomposition to Explain Multivariate Data Sets. Johannes Knittel; Andres Lalama; Steffen Koch and Thomas Ertl. IEEE Transactions on Visualization and Computer Graphics 27, 2 (2021), pp. 1374–1384. DOI: https://doi.org/10.1109/TVCG.2020.3030420
  5. 2020

    1. 2. Exploring the mysteries of system-level test. Ilia Polian; Jens Anders; Stefan Becker; Paolo Bernardi; Krishnendu Chakrabarty; Nourhan Elhamawy; Matthias Sauer; Adith Singh; Matteo Sonza Reorda and Stefan Wagner. In Proceedings of the 29th IEEE Asian Test Symposium (ATS’20), 2020. DOI: https://doi.org/10.1109/ATS49688.2020.9301557
    2. 1. Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’20), Washington DC, USA, 2020. DOI: https://doi.org/10.1109/ITC44778.2020.9325227
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