Publications

Publications of the Graduate School Intelligent Methods for Test and Reliability

Publications

  1. 2022

    1. 37. Brain-Inspired Hyperdimensional Computing for Ultra-Efficient Edge AI. Hussam Amrouch; Mohsen Imani; Xun Jiao; Yiannis Aloimonos; Cornelia Fermuller; Dehao Yuan; Dongning Ma; Hamza Errahmouni; Paul R. Genssler and Peter Sutor. In Proceedings of the 2022 International Conference on Hardware/Software Codesign and System Synthesis, 2022.
    2. 36. Cross-layer FeFET Reliability Modeling towards Robust Hyperdimensional Computing. Shubham Kumar; Swetaki Chatterjee; Simon Thomann; Paul R. Genssler; Yogesh S. Chauhan and Hussam Amrouch. In IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC’22), 2022.
    3. 35. Mitigating the Complexity of Chip Designs with ML-based Cell Library Characterization. Florian Klemme and Hussam Amrouch. In Workshop on Intelligent Methods for Test and Reliability (IMTR’22), 2022.
    4. 34. On Extracting Reliability Information from Speed Binning. Zahra Paria Najafi-Haghi; Florian Klemme; Hussam Amrouch and Hans-Joachim Wunderlich. In To appear In Proceedings of the 27th IEEE European Test Symposium (ETS’22), Barcelona, Spain, 2022.
    5. 33. Intelligent Methods for Test and Reliability. Hussam Amrouch; Jens Anders; Steffen Becker; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; André van Hoorn; Hanieh Jafarzadeh; Ingmar Kallfass; Florian Klemme; Steffen Koch; Ralf Küsters; Andrés Lalama; Raphael Latty; Yiwen Liao; Natalia Lylina; Zahra Paria Najafi-Haghi; Dirk Pflüger; Ilia Polian; Jochen Rivoir; Matthias Sauer; Denis Schwachhofer; Steffen Templin; Christian Volmer; Stefan Wagner; Daniel Weiskopf; Hans-Joachim Wunderlich; Bin Yang and Martin Zimmermann. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, 2022, pp. 1–6.
    6. 32. Self-learning tuning for post-silicon validation. Peter Domanski; Dirk Pflüger; Jochen Rivoir and Raphael Latty. In 34. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ’22)), 2022.
    7. 31. Robust Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In To appear in Proceedings of the Conference on Design, Automation and Test in Europe (DATE’22), Antwerp, Belgium, 2022, pp. 1--4.
    8. 30. Machine Learning for Reliability-Aware, yet Confidential Standard Cell Characterization. Florian Klemme and Hussam Amrouch. In The 34th Workshop on Test Methods and Reliability of Circuits and Systems (TuZ’22), 2022.
    9. 29. Design Close to the Edge in Advanced Technology using Machine  Learning and Brain-Inspired Algorithms. Hussam Amrouch; Florian Klemme and Paul R. Genssler. In 27th Asia and South Pacific Design Automation Conference  (ASP-DAC’22), 2022.
    10. 28. Towards practical application of mutation testing in industry — Traditional versus extreme mutation testing. Maik Betka and Stefan Wagner. Journal of Software: Evolution and Process (2022), pp. e2450. DOI: https://doi.org/10.1002/smr.2450
    11. 27. Efficient and Robust Resistive Open Defect Detection based on Unsupervised Deep Learning. Yiwen Liao; Zahra Paria Najafi-Haghi; Hans-Joachim Wunderlich and Bin Yang. In IEEE International Test Conference (ITC), Anaheim, USA, 2022.
    12. 26. All-in-Memory Brain-Inspired Computing using FeFET Synapses. Simon Thomann; Nguyen Hong Lam Giang; Paul R. Genssler and Hussam Amrouch. Frontiers in Electronics (2022). DOI: https://doi.org/10.3389/felec.2022.833260
    13. 25. Brain-Inspired Hyperdimensional Computing: How Thermal-Friendly for Edge Computing? Paul Genssler; Austin Vas and Hussam Amrouch. IEEE Embedded Systems Letters (ESL’22) (2022).
    14. 24. Variability-Aware Approximate Circuit Synthesis via Genetic Optimization. Konstantinos Balaskas; Florian Klemme; Georgios Zervakis; Kostas Siozios; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
    15. 23. Brain-Inspired Computing for Circuit Reliability Characterization. Paul R. Genssler and Hussam Amrouch. Transactions on Computers (TC) (2022). DOI: https://doi.org/10.1109/TC.2022.3151857
    16. 22. To Generalize or Not to Generalize: Towards Autoencoders in One-Class Classification. Yiwen Liao and Bin Yang. In International Joint Conference on Neural Networks (IJCNN) and IEEE World Congress on Computational Intelligence (WCCI), Padua, Italy, 2022.
    17. 21. Wafer Map Defect Identification Based on the Fusion of Pattern and Pixel Information. Yiwen Liao; Raphael Latty; Paul R. Genssler; Hussam Amrouch and Bin Yang. In IEEE International Test Conference (ITC’22), 2022.
  2. 2021

    1. 20. Machine Learning for Circuit Aging Estimation under Workload Dependency. Florian Klemme and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    2. 19. Brain-Inspired Computing for Wafer Map Defect Pattern Classification. Paul R. Genssler and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    3. 18. Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures. Hussam Amrouch; Anteneh Gebregiorgis; Nan Du; Said Hamdioui and Ilia Polian. In 29th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC’21), 2021.
    4. 17. Testability-Enhancing Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’21), Virtual, 2021, pp. 1--10. DOI: https://doi.org/10.1109/ITC50571.2021.00009
    5. 16. Resistive Open Defect Classification of Embedded Cells under Variations. Zahra Paria Najafi-Haghi and Hans-Joachim Wunderlich. In Proceedings of the IEEE Latin-American Test Symposium (LATS’21), Virtual, 2021, pp. 1--6. DOI: https://doi.org/10.1109/LATS53581.2021.9651857
    6. 15. Feature Selection Using Batch-Wise Attenuation and Feature Mask Normalization. Yiwen Liao; Raphaël Latty and Bin Yang. In Proceedings of the IEEE International Joint Conference on Neural Networks (IJCNN), virtual, 2021.
    7. 14. Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems. Chih-Hao Wang; Natalia Lylina; Ahmed Atteya; Tong-Yu Hsieh and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Symposium on On-Line Testing And Robust System Design (IOLTS’21), Virtual, 2021, pp. 1--7. DOI: https://doi.org/10.1109/IOLTS52814.2021.9486710
    8. 13. Security, Reliability and Test Aspects of the RISC-V Ecosystem. Jaume Abella; Sergi Alcaide; Jens Anders; Francisco Bas; Steffen Becker; Elke De Mulder; Nourhan Elhamawy; Frank K. Gürkaynak; Helena Handschuh; Carles Hernandez; Mike Hutter; Leonidas Kosmidis; Ilia Polian; Matthias Sauer; Stefan Wagner and Francesco Regazzoni. In Proceedings of the 26th IEEE European Test Symposium (ETS’21), 2021.
    9. 12. Impact of Transistor Self-Heating  on Logic Gates. Victor M. van Santen; Linda Schillinger and Hussam Amrouch. In IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT’21), Virtual, 2021.
    10. 11. A Hybrid Protection Scheme for Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya and Hans-Joachim Wunderlich. In Proceedings of the IEEE VLSI Test Symposium (VTS’21), Virtual, 2021, pp. 1--7. DOI: https://doi.org/10.1109/VTS50974.2021.9441029
    11. 10. Machine Learning for Semiconductor Test and Reliability. Hussam Amrouch; Animesh Basak Chowdhury; Wentian Jin; Ramesh Karri; Khorrami Farshad; Prashanth Krishnamurthy; Ilia Polian; Victor M. van Santen; Benjamin Tan and Sheldon Tan. In IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    12. 9. Towards Utilizing Self-awareness During System-level Test. Denis Schwachhofer; Steffen Becker; Matthias Sauer; Stefan Wagner and Ilia Polian. In 33. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ’21)), 2021.
    13. 8. Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. Om Prakash; Chetan Dabhim; Yogesh Chauhan and Hussam Amrouch. In To appear in Proceedings of IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    14. 7. Anomaly Detection Based on Selection and Weighting in Latent Space. Yiwen Liao; Alexander Bartler and Bin Yang. In Proceedings of the IEEE International Conference on Automation Science and Engineering (CASE21), Lyon, France, 2021.
    15. 6. Extreme mutation testing in practice: An industrial case study. Maik Betka and Stefan Wagner. In 2021 IEEE/ACM International Conference on Automation of Software Test (AST), 2021, pp. 113–116. DOI: https://doi.org/10.1109/AST52587.2021.00021
    16. 5. ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems. Peter Domanski; Dirk Pflüger; Jochen Rivoir and Raphaël Latty. In 2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA), 2021, pp. 1357--1364.
    17. 4. Visual Neural Decomposition to Explain Multivariate Data Sets. Johannes Knittel; Andres Lalama; Steffen Koch and Thomas Ertl. IEEE Transactions on Visualization and Computer Graphics 27, 2 (2021), pp. 1374–1384. DOI: https://doi.org/10.1109/TVCG.2020.3030420
    18. 3. Machine Learning for On-the-fly Reliability-Aware Cell Library Characterization. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2021).
  3. 2020

    1. 2. Exploring the mysteries of system-level test. Ilia Polian; Jens Anders; Stefan Becker; Paolo Bernardi; Krishnendu Chakrabarty; Nourhan Elhamawy; Matthias Sauer; Adith Singh; Matteo Sonza Reorda and Stefan Wagner. In Proceedings of the 29th IEEE Asian Test Symposium (ATS’20), 2020. DOI: https://doi.org/10.1109/ATS49688.2020.9301557
    2. 1. Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’20), Washington DC, USA, 2020. DOI: https://doi.org/10.1109/ITC44778.2020.9325227
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