Publications

Publications of the Graduate School Intelligent Methods for Test and Reliability

Publications

  1. 2022

    1. 25. Intelligent Methods for Test and Reliability. Hussam Amrouch; Jens Anders; Steffen Becker; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; André van Hoorn; Hanieh Jafarzadeh; Ingmar Kallfass; Florian Klemme; Steffen Koch; Ralf Küsters; Andrés Lalama; Raphael Latty; Yiwen Liao; Natalia Lylina; Zahra Paria Najafi-Haghi; Dirk Pflüger; Ilia Polian; Jochen Rivoir; Matthias Sauer; Denis Schwachhofer; Steffen Templin; Christian Volmer; Stefan Wagner; Daniel Weiskopf; Hans-Joachim Wunderlich; Bin Yang and Martin Zimmermann. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, 2022, pp. 1–6.
    2. 24. Robust Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In To appear in Proceedings of the Conference on Design, Automation and Test in Europe (DATE’22), Antwerp, Belgium, 2022, pp. 1--4.
    3. 23. Towards practical application of mutation testing in industry — Traditional versus extreme mutation testing. Maik Betka and Stefan Wagner. Journal of Software: Evolution and Process (2022), pp. e2450. DOI: https://doi.org/10.1002/smr.2450
    4. 22. All-in-Memory Brain-Inspired Computing using FeFET Synapses. Simon Thomann; Nguyen Hong Lam Giang; Paul R. Genssler and Hussam Amrouch. Frontiers in Electronics (2022). DOI: https://doi.org/10.3389/felec.2022.833260
    5. 21. Brain-Inspired Computing for Circuit Reliability Characterization. Paul R. Genssler and Hussam Amrouch. Transactions on Computers (TC) (2022). DOI: https://doi.org/10.1109/TC.2022.3151857
  2. 2021

    1. 20. Machine Learning for Circuit Aging Estimation under Workload Dependency. Florian Klemme and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    2. 19. Brain-Inspired Computing for Wafer Map Defect Pattern Classification. Paul R. Genssler and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    3. 18. Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures. Hussam Amrouch; Anteneh Gebregiorgis; Nan Du; Said Hamdioui and Ilia Polian. In 29th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC’21), 2021.
    4. 17. Testability-Enhancing Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’21), Virtual, 2021, pp. 1--10. DOI: https://doi.org/10.1109/ITC50571.2021.00009
    5. 16. Resistive Open Defect Classification of Embedded Cells under Variations. Zahra Paria Najafi-Haghi and Hans-Joachim Wunderlich. In Proceedings of the IEEE Latin-American Test Symposium (LATS’21), Virtual, 2021, pp. 1--6. DOI: https://doi.org/10.1109/LATS53581.2021.9651857
    6. 15. Feature Selection Using Batch-Wise Attenuation and Feature Mask Normalization. Yiwen Liao; Raphaël Latty and Bin Yang. In Proceedings of the IEEE International Joint Conference on Neural Networks (IJCNN), virtual, 2021.
    7. 14. Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems. Chih-Hao Wang; Natalia Lylina; Ahmed Atteya; Tong-Yu Hsieh and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Symposium on On-Line Testing And Robust System Design (IOLTS’21), Virtual, 2021, pp. 1--7. DOI: https://doi.org/10.1109/IOLTS52814.2021.9486710
    8. 13. Security, Reliability and Test Aspects of the RISC-V Ecosystem. Jaume Abella; Sergi Alcaide; Jens Anders; Francisco Bas; Steffen Becker; Elke De Mulder; Nourhan Elhamawy; Frank K. Gürkaynak; Helena Handschuh; Carles Hernandez; Mike Hutter; Leonidas Kosmidis; Ilia Polian; Matthias Sauer; Stefan Wagner and Francesco Regazzoni. In Proceedings of the 26th IEEE European Test Symposium (ETS’21), 2021.
    9. 12. Impact of Transistor Self-Heating  on Logic Gates. Victor M. van Santen; Linda Schillinger and Hussam Amrouch. In IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT’21), Virtual, 2021.
    10. 11. A Hybrid Protection Scheme for Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya and Hans-Joachim Wunderlich. In Proceedings of the IEEE VLSI Test Symposium (VTS’21), Virtual, 2021, pp. 1--7. DOI: https://doi.org/10.1109/VTS50974.2021.9441029
    11. 10. Machine Learning for Semiconductor Test and Reliability. Hussam Amrouch; Animesh Basak Chowdhury; Wentian Jin; Ramesh Karri; Khorrami Farshad; Prashanth Krishnamurthy; Ilia Polian; Victor M. van Santen; Benjamin Tan and Sheldon Tan. In IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    12. 9. Towards Utilizing Self-awareness During System-level Test. Denis Schwachhofer; Steffen Becker; Matthias Sauer; Stefan Wagner and Ilia Polian. In 33. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ’21)), 2021.
    13. 8. Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. Om Prakash; Chetan Dabhim; Yogesh Chauhan and Hussam Amrouch. In To appear in Proceedings of IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    14. 7. Extreme mutation testing in practice: An industrial case study. Maik Betka and Stefan Wagner. In 2021 IEEE/ACM International Conference on Automation of Software Test (AST), 2021, pp. 113–116. DOI: https://doi.org/10.1109/AST52587.2021.00021
    15. 6. Anomaly Detection Based on Selection and Weighting in Latent Space. Yiwen Liao; Alexander Bartler and Bin Yang. In Proceedings of the IEEE International Conference on Automation Science and Engineering (CASE21), Lyon, France, 2021.
    16. 5. ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems. Peter Domanski; Dirk Pflüger; Jochen Rivoir and Raphaël Latty. In 2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA), 2021, pp. 1357--1364.
    17. 4. Machine Learning for On-the-fly Reliability-Aware Cell Library Characterization. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2021).
    18. 3. Visual Neural Decomposition to Explain Multivariate Data Sets. Johannes Knittel; Andres Lalama; Steffen Koch and Thomas Ertl. IEEE Transactions on Visualization and Computer Graphics 27, 2 (2021), pp. 1374–1384. DOI: https://doi.org/10.1109/TVCG.2020.3030420
  3. 2020

    1. 2. Exploring the mysteries of system-level test. Ilia Polian; Jens Anders; Stefan Becker; Paolo Bernardi; Krishnendu Chakrabarty; Nourhan Elhamawy; Matthias Sauer; Adith Singh; Matteo Sonza Reorda and Stefan Wagner. In Proceedings of the 29th IEEE Asian Test Symposium (ATS’20), 2020. DOI: https://doi.org/10.1109/ATS49688.2020.9301557
    2. 1. Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’20), Washington DC, USA, 2020. DOI: https://doi.org/10.1109/ITC44778.2020.9325227
To the top of the page