June 10, 2021

Special session "System-Level Test: State of the Art and Challenges'' at IOLTS'21

Special session called "System-Level Test: State of the Art and Challenges" is organized by Matteo Sonza Reorda (Politecnico di Torino, GS-IMTR Advisory Board member) and Ilia Polian (researcher in GS-IMTR) at the On-Line Test Symposium 2021 (IOLTS'21).

The Special Session consists of three presentation by speakers from the industry.
Davide Appello (STMicroelectronics, Italy) elaborates on how to use data gathered from system-level test (SLT) results in an automotive environment to optimize the overall test flow and presents results observed on approximately 20 million manufactured 28nm and 40nm automotive system-on-chip (SoC) designs.
Matthias Sauer (Advantest, Germany) provides an overview on how to assess the effectiveness and economical usefulness of SLT.
Harry Chen (Mediatek, Taiwan) outlines advanced techniques to pinpoint the root causes of the behaviors observed during SLT and reports some results for a CPU block in a 7nm 5G mobile SoC product.

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