Special session entitled "Machine Learning for Semiconductor Reliability" was organized by H. Amrouch and I. Polian at the IEEE VLSI Test Symposium (VTS'21). The special session was presented on 26th April jointly with University of New York and University of California Riverside.
It focuses on the usage of machine learning in several test and reliability-related areas and discusses how novel physics-informed neural networks can be employed to model electrostatic problems in VLSI designs.