In a small workshop, J.-Prof. Hussam Amrouch introduced Prof. Jinjun Xiong, Empire Innovation Professor with the Department of Computer Science and Engineering at University at Buffalo, USA, to the Graduate School of Intelligent Methods for Test and Reliability. He introduced the vision and broad scope of the graduate school and explained how each project contributes to the common goal of making semiconductor testing smarter. Each graduate student presented their project briefly, followed by questions and discussion with Prof. Xiong. They gave a comprehensive overview of the different topics of the graduate school dealing with test and reliability.
